scanning electron microscope services
SCANNING ELECTRON MICROSCOPY

BSD & SED IMAGING | POINT & MAPPING EDS ANALYSIS | PARTICLE & PORE ANALYSIS | FIBER ANALYSIS

BSD & SED IMAGING | POINT & MAPPING EDS ANALYSIS | PARTICLE & PORE ANALYSIS | FIBER ANALYSIS

BSD & SED IMAGING | POINT & MAPPING EDS ANALYSIS | PARTICLE & PORE ANALYSIS | FIBER ANALYSIS

failure analysis with scanning electron microscope(SEM)
ANALYTICAL SERVICES WITH SEM

CONTAMINATION & FOREIGN PARTICLE IDENTIFICATION | DEFECT IDENTIFICATION | SURFACE QUALITY ANALYSIS

CONTAMINATION & FOREIGN PARTICLE IDENTIFICATION | DEFECT IDENTIFICATION | SURFACE QUALITY ANALYSIS

CONTAMINATION & FOREIGN PARTICLE IDENTIFICATION | DEFECT IDENTIFICATION | SURFACE QUALITY ANALYSIS

Particle Analysis and Elemental Analysis
PARTICLE ANALYSIS WITH EDS

ANALYSIS WITH ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS) | PARTICLE SIZE DISTRIBUTION | ELEMENTAL IDENTIFICATION

ANALYSIS WITH ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS) | PARTICLE SIZE DISTRIBUTION | ELEMENTAL IDENTIFICATION

ANALYSIS WITH ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS) | PARTICLE SIZE DISTRIBUTION | ELEMENTAL IDENTIFICATION

scanning electron microscope(SEM) Expert Zachary Gray Ph.D.
TALK TO OUR TEAM

ONE-ON-ONE CONSULTATION | RESPONSIVE | RELIABLE | DEPENDABLE

ONE-ON-ONE CONSULTATION | RESPONSIVE | RELIABLE | DEPENDABLE

ONE-ON-ONE CONSULTATION | RESPONSIVE | RELIABLE | DEPENDABLE

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Microscopy Analysis

We provide scanning electron microscopy and elemental analysis for a wide range of applications.  Combining the high spatial resolution of the SEM, large depth of field, and elemental analysis capabilities, we can provide information not available from optical or probe techniques.  Our software capabilities provide consistent reporting and analysis of many types of materials, including fibers, particles, and pores.  Combined with elemental analysis we can provide invaluable statistical information on additives used in 3D printing or contaminants to be identified for technical cleanliness applications.  Defect analysis, foreign particle identification, and coating coverage statistics are a sampling of what we can provide.

One-On-One Consultation

Project Analysis and Service Needs

We provide consultation with our customers on needs, whether they simply require basic SEM images of their unmodified samples, or if there is extensive sample preparation and analysis routines to be defined. Considerations during consultation:

  • Sample preparation: cutting, polishing, mounting and/or coating of samples
  • Elemental Analysis: Point, line, and elemental mapping, particle and feature specific EDS statistics
  • Image Statistics: Particle, Fiber, Pore statistical analysis
  • Image resolution, pixel size, field of view, randomized or automated sets of images
  • Real-time remote viewing option and scheduling

Optimized SEM & Sample Conditions

Quality Data Every Time

Each project requires proper SEM optimization to guarantee the best possible resolution, consideration, and choice of backscatter or secondary detector, EDS algorithm model to best identify elements in the sample. Field of view and resolution will affect reporting parameters. Accelerating voltage and source current will affect imaging contrast, resolution, and EDS. Sample preparation can remove or create artifacts and determine whether relevant data is being collected. All of these variables will be optimized based on our customer’s needs as assessed during the consultation.

Comprehensive Reporting

Making Data Comprehendible

With a strict quality system in place, we strive to produce reliable, repeatable data presented to address your goals and expectations. Image data, Elemental data & maps, statistical data on feature size, distribution, orientation are a few of the components we regularly report.

Energy Dispersive X-Ray Spectroscopy

Energy Dispersive X-Ray Spectroscopy (also known as EDS/EDX or EDAX) allows us to determine the elemental makeup of the sample being imaged. We provide point analysis on areas of interest, line scan analysis across the sample, or full EDS image maps that represent elemental makeup of whole regions of the sample. EDS can be combined with particle analysis to provide statistics on particles with different elemental makeup.

  • Detect elements from Boron to Americium
  • Provide point analysis on areas of interest
  • Provide line analysis across regions of interest
  • Provide entire elemental maps (up to 10 elements)
  • Overlay EDS data with image data (EDS mapping)

Backscattered Electron Imaging and Secondary Electron Detection

Utilizing both backscattered electron imaging (BSE) and secondary electron detection (SED) we are able to provide you with topographical details of your sample.

  • BSE for images containing compositional information of the sample
  • Imaging of non-conductive samples without coating or any other sample prep (BSE only)
  • SE imaging for imaging with high surface sensitivity and best resolution
  • 3D reconstruction: examine your surface in 3D, extract surface profiles, and calculate roughness

Coating Coverage Analysis

Utilizing the backscatter electron detector, we can provide coating coverage analysis. Using X-ray mapping to differentiate between a coating and the base substrate is used to determine coating coverage. But, this is time consuming for a single image frame. Our methods use elemental contrast shown using the backscatter detector, we are able to provide a percent coverage on parts with statistical information to help determine if each part meets your process requirements.

Fiber Analysis and Characterization

We can help you accelerate your quality control and assurance analysis in the manufacturing of fibers used in multiple industries. Our SEM images provide high-quality detail. We combine this with software that measures the surface porosity and fiber density resulting in quantitative fiber size (fiber diameter), fiber orientation, fiber distribution and porosity statistics in orders of magnitude less time than manually counting.

  • 100nm – 40 µm diameter range
  • Customized fiber and pore distribution histograms
  • Minimum, maximum, and average diameter statistics
  • Fiber orientation and characterization
  • We can provide fast results on many samples, with 1000s of fiber measurements per day

Particle Analysis and Elemental Analysis

Specialized analysis for particle size distribution and elemental identification, our capabilities will help you identify and quantify the material in your sample. Combining backscatter contrast we can identify and differentiate material structures that are unique from the background. We provide histograms, scatter plots and generated images in a selected format to best report the data most relevant to you.

Our particle analysis combined with SEM imaging data provides the details of the elemental composition of particles both foreign and known in your sample. Measurements can include:

  • Diameter, circularity, aspect ratio, circumference, and pore size distribution
  • Convenient plotting and reporting
  • Programs customized to each sample type

High-Resolution Marketing Collateral

High-resolution imagery of your sample and/or data is key for tradeshows, publications, data analysis, and print or web marketing. Our SEM imaging services can provide EDS color overlay, sample image stitching, and high-quality images from 150,000x with sub-10 nm resolution. We provide each client with a folder containing the following file types to anticipate your marketing needs and image application:

  • JPEG (or JPG) – Joint Photographic Experts Group
  • PNG – Portable Network Graphics
  • GIF – Graphics Interchange Format
  • TIFF – Tagged Image File
  • PSD – Photoshop Document
  • PDF – Portable Document Format

Industry and Applications

  • Automotive Industry
  • Additive Manufacturing
  • Fibers, Textiles, & Paper Industry
  • Filtration Industry
  • Consumer Electronics Industry
  • Solar, and Wind Energies Industry
  • Thin Films & Hard Coatings
  • Semiconductors/Microelectronics Industry
  • Aerospace Industry
  • Polymers
  • Pharmaceutical Industry & Medical Devices
  • Optics & Photonics Industry

Questions about Microscopy Analysis?

Contact us for additional SEM consultation services.