SCANNING ELECTRON MICROSCOPY

BSD & SED IMAGING | POINT & MAPPING EDS ANALYSIS | PARTICLE & PORE ANALYSIS | FIBER ANALYSIS

BSD & SED IMAGING | POINT & MAPPING EDS ANALYSIS | PARTICLE & PORE ANALYSIS | FIBER ANALYSIS

BSD & SED IMAGING | POINT & MAPPING EDS ANALYSIS | PARTICLE & PORE ANALYSIS | FIBER ANALYSIS

ANALYTICAL SERVICES WITH SEM

CONTAMINATION & FOREIGN PARTICLE IDENTIFICATION | DEFECT IDENTIFICATION | SURFACE QUALITY ANALYSIS

CONTAMINATION & FOREIGN PARTICLE IDENTIFICATION | DEFECT IDENTIFICATION | SURFACE QUALITY ANALYSIS

CONTAMINATION & FOREIGN PARTICLE IDENTIFICATION | DEFECT IDENTIFICATION | SURFACE QUALITY ANALYSIS

PARTICLE ANALYSIS WITH EDS

ANALYSIS WITH ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS) | PARTICLE SIZE DISTRIBUTION | ELEMENTAL IDENTIFICATION

ANALYSIS WITH ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS) | PARTICLE SIZE DISTRIBUTION | ELEMENTAL IDENTIFICATION

ANALYSIS WITH ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS) | PARTICLE SIZE DISTRIBUTION | ELEMENTAL IDENTIFICATION

TALK TO OUR TEAM

ONE-ON-ONE CONSULTATION | RESPONSIVE | RELIABLE | DEPENDABLE

ONE-ON-ONE CONSULTATION | RESPONSIVE | RELIABLE | DEPENDABLE

ONE-ON-ONE CONSULTATION | RESPONSIVE | RELIABLE | DEPENDABLE

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Scanning Electron Microscopy

SEM Imaging

Both BSE (Backscattered Electron) and SE (Secondary Electron) imaging capabilities are available on our SEMs. Backscattered electrons provide elemental contrast while secondary provide topographical information. The two can also be combined to provide both types of information. Our SEM’s high brightness CeB6 electron source provides crisp images.

Resolution

SEM resolution can depend on several factors, such as vacuum levels, sample conductivity, and detector type, however, we can generally obtain 10nm resolution on our instruments, and sometimes much better. Our magnification range is nominally 80x – 150,000x. Digital zoom can increase magnification by 12x via the SEM. Consultation with a scientist is needed to better understand how your samples affect our resolution capabilities.

phenom-xl

Standard Capabilities

ELEMENTAL ANALYSIS (EDS/EDX/EDAX)

Point EDS, line scan EDS and EDS mapping are available. EDS maps can be acquired up to 512×512 pixels and line scans of 512 pixels. The elemental detection capability is from Boron to Americium.

SAMPLE SIZE

We can accommodate samples up to 100×100 mm in size and a height of 65mm.

FIELD OF VIEW

We can obtain single images down to 80x magnification, but we can also provide high resolution stitched images with a maximum field of view of 8.07mm, minimum magnification of 31.8x). Stitched images can contain 1,000s of individual micrographs with the final image at gigapixel resolution.

REMOTE ACCESS

We can provide you with remote access to our SEMs, and after a short training session, you can control the SEM, obtain SEM and EDS data on your own.

COOLING/CRYO SAMPLE STAGE

A cooling stage allows you to image “wet” samples without drying. By freezing the sample you can obtain high-resolution SEM data without the harmful effects of drying or desiccation.

Other Capabilities

SAMPLE PREPARATION

We can sputter coat non-conductive samples if required. Our SEMs do provide a charge reduction mode, that may be sufficient depending on your resolutions needs. We can also cut, polish, and ion mill samples if required. Our ion mill can cross-section, slope cut, and polish a wide range of materials.

TENSILE TESTING

Our in-situ tensile and compression tester can perform these tests for real-time viewing in the SEM. We can create movies that record your material’s response at high resolutions. SEM and EDS data can also be acquired before and after the testing is performed.

Questions about our SEM capabilities?

Contact us for additional imaging and elemental analysis capabilities.