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Scanning Electron Microscopy

Scanning Electron Microscopy (SEM) is an indispensable technique for obtaining high resolution images of materials, together with critical information about morphology and surface topology.  Compared with optical microscopes, SEM offers far greater magnification and depth of field, yielding extraordinarily detailed images of a sample’s surface and near-surface regions.

SEM Image of Salt
  • View data acquisition remotely
  • EDS/EDX elemental analysis and mapping
  • Up to 130,000x magnification
  • High depth of field
  • Specialized analysis for Particle size distribution & EDS
    • Pore size distribution
    • Fiber size and orientation statistics
  • Low temperature SEM for wet samples
  • Large area, high resolution SEM micrographs (via image stitching)

 

        Contact us for additional imaging and elemental analysis capabilities

Fly Eye

SEM Imaging

High resolution SEM imaging with both back-scatter and secondary electron images. Image stitching for large field of view, and high depth of focus images.  Many non-conducting samples can be imaged without coating.
EDS for Filtration Practices

Elemental Analysis

Elemental analysis with SEM lets you correlate your material composition with the high resolution image.  Point analysis, line analysis, and elemental maps.
Particle Sizing & Analysis

Particle Sizing & Analysis

Automated particle sizing and analysis to determine size distribution.  Very fast analysis on thousands of particles.
Fiber Size

Fiber Sizing & Analysis

Automated fiber analysis for operator independent statistics on diameter size distribution.  Ability to analyze thousands of fibers short periods of time.