Final Polishing and Cleaning
We utilize dual ion gun Argon (Ar) ion milling instrumentation to properly prepare scratch free sample surfaces for metallurgical and EBSD studies.
Metallurgical Mounting, Ion Mill and SEM
We can perform the full service of mounting, polishing, ion milling and SEM imaging on your samples. Thin films deposited over a substrate can be cross sectioned for direct measurement of the film thickness of tens of layers accurately. Interlayer bonding and diffusion of materials across layers can be identified with the EDS maps of cross sections.
Identification of details of device connections, microstructure of joint to reveal any voids, cracks, metal diffusion/migration at interlayer for joint quality.