scanning electron microscope services
SCANNING ELECTRON MICROSCOPY

BSD & SED IMAGING | POINT & MAPPING EDS ANALYSIS | PARTICLE & PORE ANALYSIS | FIBER ANALYSIS

BSD & SED IMAGING | POINT & MAPPING EDS ANALYSIS | PARTICLE & PORE ANALYSIS | FIBER ANALYSIS

BSD & SED IMAGING | POINT & MAPPING EDS ANALYSIS | PARTICLE & PORE ANALYSIS | FIBER ANALYSIS

failure analysis with scanning electron microscope(SEM)
FAILURE ANALYSIS SERVICES WITH THE SEM

CONTAMINATION & FOREIGN PARTICLE ANALYSIS | DEFECT IDENTIFICATION | SURFACE QUALITY ANALYSIS

CONTAMINATION & FOREIGN PARTICLE ANALYSIS | DEFECT IDENTIFICATION | SURFACE QUALITY ANALYSIS

CONTAMINATION & FOREIGN PARTICLE ANALYSIS | DEFECT IDENTIFICATION | SURFACE QUALITY ANALYSIS

Additive Manufacturing Component Analysis
ADDITIVE MANUFACTURING COMPONENT ANALYSIS

ANALYSIS OF ADDITIVE MANUFACTURING(AM) POWDER BED FUSION COMPONENTS, LIQUID RESIN PHOTOPOLYMERS, AND MATERIAL EXTRUSION ADHESION LAYERS. MATERIAL ANALYSIS OF THERMOPLASTICS, METAL ALLOYS, CERAMICS AND BIOCHEMICAL FOR OBJECT CLEANLINESS & MATERIAL ARRANGEMENT SCAFFOLDING.

ANALYSIS OF ADDITIVE MANUFACTURING(AM) POWDER BED FUSION COMPONENTS, LIQUID RESIN PHOTOPOLYMERS, AND MATERIAL EXTRUSION ADHESION LAYERS. MATERIAL ANALYSIS OF THERMOPLASTICS, METAL ALLOYS, CERAMICS AND BIOCHEMICAL FOR OBJECT CLEANLINESS & MATERIAL ARRANGEMENT SCAFFOLDING.

ANALYSIS OF ADDITIVE MANUFACTURING(AM) POWDER BED FUSION COMPONENTS, LIQUID RESIN PHOTOPOLYMERS, AND MATERIAL EXTRUSION ADHESION LAYERS. MATERIAL ANALYSIS OF THERMOPLASTICS, METAL ALLOYS, CERAMICS AND BIOCHEMICAL FOR OBJECT CLEANLINESS & MATERIAL ARRANGEMENT SCAFFOLDING.

Particle Analysis and Elemental Analysis
PARTICLE ANALYSIS WITH EDS

SPECIALIZED ANALYSIS WITH ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS) FOR PARTICLE SIZE DISTRIBUTION AND ELEMENTAL IDENTIFICATION. WE PROVIDE HISTOGRAMS, SCATTER PLOTS AND HIGH-RESOLUTION IMAGING TO REPORT THE DATA MOST RELEVANT TO YOU.

SPECIALIZED ANALYSIS WITH ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS) FOR PARTICLE SIZE DISTRIBUTION AND ELEMENTAL IDENTIFICATION. WE PROVIDE HISTOGRAMS, SCATTER PLOTS AND HIGH-RESOLUTION IMAGING TO REPORT THE DATA MOST RELEVANT TO YOU.

SPECIALIZED ANALYSIS WITH ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS) FOR PARTICLE SIZE DISTRIBUTION AND ELEMENTAL IDENTIFICATION. WE PROVIDE HISTOGRAMS, SCATTER PLOTS AND HIGH-RESOLUTION IMAGING TO REPORT THE DATA MOST RELEVANT TO YOU.

scanning electron microscope(SEM) Expert Zachary Gray Ph.D.
TALK TO OUR EXPERTS

OUR TEAM HAS UNMATCHED EXPERIENCE WITH OUR STATE-OF-THE-ART SEM & OPTICAL PROFILERS. WITH YEARS OF CLIENT SEM INSTRUCTIONAL TRAINING AND SEM CONTRACT ANALYSIS, OUR TEAM IS MORE THAN HAPPY TO PROVIDE OVER THE PHONE CONSULTATION FOR YOUR SAMPLE AND SEM CONTRACT SERVICE NEEDS.

OUR TEAM HAS UNMATCHED EXPERIENCE WITH OUR STATE-OF-THE-ART SEM & OPTICAL PROFILERS. WITH YEARS OF CLIENT SEM INSTRUCTIONAL TRAINING AND SEM CONTRACT ANALYSIS, OUR TEAM IS MORE THAN HAPPY TO PROVIDE OVER THE PHONE CONSULTATION FOR YOUR SAMPLE AND SEM CONTRACT SERVICE NEEDS.

OUR TEAM HAS UNMATCHED EXPERIENCE WITH OUR STATE-OF-THE-ART SEM & OPTICAL PROFILERS. WITH YEARS OF CLIENT SEM INSTRUCTIONAL TRAINING AND SEM CONTRACT ANALYSIS, OUR TEAM IS MORE THAN HAPPY TO PROVIDE OVER THE PHONE CONSULTATION FOR YOUR SAMPLE AND SEM CONTRACT SERVICE NEEDS.

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What is Scanning Electron Microscopy?

Scanning Electron Micrscopy (SEM) is a powerful technique using a focused beam of electrons to produce high magnification and high-resolution images. SEM analysis ideal for identifying and investigating critical morphology, surface flaws and topography, contamination or corrosion. Microscopy service is combined with other analytical techniques such as Energy Dispersive X-Ray Spectroscopy (also known as EDS/EDX/EDAX) analyzes the elemental composition and distribution of those elements within that sample are determined.

Why use our SEM Services?

We are the experts in analyzing many different kinds of samples. When compared to traditional light microscopes SEM offers far greater magnification and higher depths of field, yielding extraordinarily detailed high-resolution images of the surface of a sample and near-surface regions. One of the most widely used analytical methods, SEM uses high energy electrons to produce detailed surface topography images. Coupled to an auxiliary Energy Dispersive X-ray Spectroscopy (EDS/EDX/EDAX) detector, SEM also offers elemental identification of nearly the entire periodic table.

SEM material characterization services include:

  • Energy Dispersive X-Ray Spectroscopy
  • Backscattered Electron Imaging and Secondary Electron Detection
  • Coating Coverage Analysis
  • Fiber Analysis and Characterization
  • Particle Analysis and Elemental Analysis
  • High-Resolution Marketing Images
Optical Microscope image of fibersSEM image, nanofibers
Energy Dispersive X-Ray Spectroscopy, SEM software and analysis

Energy Dispersive X-Ray Spectroscopy

Energy Dispersive X-Ray Spectroscopy (also known as EDS/EDX or EDAX) allows us to determine the elemental makeup of the sample being imaged. Our scientists leverage their in-depth knowledge across diverse applications to assist you in identifying and resolving product quality issues.

  • Detect elements from Boron to Americium
  • Provide point analysis on areas of interest
  • Provide line analysis across regions of interest
  • Provide entire elemental maps (up to 10 elements)
  • Overlay EDS data with image data (EDS mapping)

Backscattered Electron Imaging and Secondary Electron Detection

Utilizing both backscattered electron imaging (BSE) and secondary electron detection (SED) we are able to provide you with topographical details of your sample.

  • BSE for images containing compositional information of the sample
  • Imaging of non-conductive samples without gold coating or any other sample prep (BSE only)
  • SE imaging for imaging with high surface sensitivity and best resolution
  • 3D reconstruction: examine your surface in 3D, extract surface profiles, and calculate roughness
tungsten skyline, SEM Imaging
Backscattered Electron SEM Image of Zinc Phosphate Coating,

Coating Coverage Analysis

With the analysis for coating coverage (utilizing backscattered electron imagining), we can provide coverage analysis. By identifying and differentiating the voids in the coating material we can identify structures that are unique from the background. We provide histograms, scatter plots and coating coverage and spatially resolved elemental composition using energy dispersive X-ray spectroscopy (EDS).

Fiber Analysis and Characterization

We can help you accelerate your quality control and assurance analysis in the manufacturing of fibers used in multiple industries. Our SEM images provide high-quality detail, we combine this with software that measures the surface porosity and fiber density resulting in quantitative fiber size (fiber diameter), fiber orientation, fiber distribution and porosity statistics in orders of magnitude less time than manually counting.

  • 100nm – 40 µm diameter range
  • Customized fiber and pore distribution histograms
  • Minimum, maximum, and average diameter statistics
  • Standard deviation
  • Fiber orientation

We can provide fast results on many samples, with 1000s of fiber measurements per day.

Nanofibers, FiberMetric software, SEM Imaging and analysis
Particle Size, Distribution and Elemental ID, SEM software analysis

Particle Analysis and Elemental Analysis

Specialized analysis for particle size distribution and elemental identification, our capabilities will help you identify and quantify the material in your sample. Combining backscatter contrast we can identify and differentiate material structures that are unique from the background. We provide histograms, scatter plots and generated images in a selected format to best report the data most relevant to you. Histograms of any measured particle property are generated by numerical value and volume. Scatter plots can be plotted from any combination of particle properties to reveal correlations and trends.

Our particle analysis combined with SEM imaging data provides the details of the elemental composition of particles both foreign and known in your sample. Measurements can include:

  • Diameter
  • Circularity
  • Aspect ratio
  • Major axis
  • Minor axis
  • Circumference
  • Pore size distribution
  • Convenient plotting and reporting
  • Programs customized to each sample type

Questions about our SEM services?

Contact us for additional imaging and elemental analysis capabilities.
We provide expert guidance for your analytical needs.