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Surface Metrology

Surface Metrology

Optical profilometry and surface metrology meet the needs of challenging surface analysis for complex surfaces. This methodology accepts a wide variety of materials and offers contact and non-contact characterization in both 2-D and 3-D for surface morphology. These methods are ideal for imaging and measuring surface height, roughness and feature volume with a high degree of accuracy.

Ideal for analyzing complex surfaces such as:

  • LED patterned/etched substrates
  • Photo-resist and stacked structures
  • Transparent surfaces
  • Patterned sapphire substrates (PSS) bump diameter, height and pitch analysis
  • Microfluidics transparent multi-surface profiling
  • High aspect ratio samples such as microneedles

Method Features:

  • Non-destructive
  • 3D surface topography & surface roughness
  • Surface wear, scratch and corrosion
  • True color measurements


        Contact us for our full list of capabilities and a free consultation session

  • 3D Image of a Glass Fracture
3D Image of a Glass Fracture
  • 3D Image of a Copper Trench
3D Image of a Copper Trench
AFM Thumbnail

Atomic Force Microscopy

Nanoscale Surface roughness and topography
Laser Topography

Optical Profilometry

Pattern Projection and White Light Interferometry techniques provide non-contact optical 3D metrology data