Oxide Layer Removal with Ion Milling

Performing EDS on a oxidized material results in poor data, as the oxide layer will obscure and mix with the data from the underlying bulk material which is typically of most interest.

Ion milling removes the top oxidation layer giving accurate EDS quantification of the materials. The analysis can be performed on particles embedded in metallographic mounts and independent metal samples

EBSD – Electron Backscatter Diffraction measurements

Good diffraction data via EBSD requires a crystalline, damage-free, and oxide-free surface.  Damage free cleaning, cross-sectioning, and oxide removal via ion milling is the best way to get quality data.

Microstructure analysis determines grain orientations, which can provide critical information about material strength and how process temperatures affect their formation.

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Author

Devendra Verma, Ph.D.
Devendra Verma, Ph.D.

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